doc. no : qw0905-: rev : date : a 29 - sep - 2005 LA12540 data sheet LA12540 round t ype led lamps ligitek electronics co.,ltd. property of ligitek only
directivity radiation package dimensions note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. ligitek electronics co.,ltd. property of ligitek only part no. LA12540 page 1/4 4.0 3.0 1.15 25.0min 1.0min ?? 0.5 typ 2.54typ 1.5max 5.9 0 x 60 x 100% 50% 25% 0 25% 75% 30 x -60 x 50% 75% 100% -30 x
luminous intensity @10ma(mcd) spectral halfwidth ??f nm dominant wave length f dnm forward voltage @ ma(v) viewing angle 2 c 1/2 (deg) LA12540 note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. yellow emitted gaasp/gap part no material lens orange diffused 592 color typ. 30 max. min. min. 35 1.7 2.6 12 20 38 storage temperature soldering temperature operating temperature typical electrical & optical characteristics (ta=25 j ) tsol tstg t opr max 260 j for 5 sec max (2mm from body) -40 ~ +100 -40 ~ +85 j j power dissipation reverse current @5v peak forward current duty 1/10@10khz forward current absolute maximum ratings at ta=25 j part no. symbol parameter unit i fp pd ir i f 80 ma 60 10 mw g a 20 a ma ligitek electronics co.,ltd. property of ligitek only LA12540 ratings page 2/4
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 500 550 600 650 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 700 y-a chip page 3/4 part no. l a12540
low temperature storage test the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test solder resistance test this test intended to see soldering well performed or not. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. thermal shock test high temperature high humidity test 1.ta=65 j? 5 j 2.rh=90 %~95 % 3.t=240hrs ? 2hrs the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles the purpose of this test is the resistance of the device under tropical for hous. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 ligitek electronics co.,ltd. property of ligitek only high temperature storage test operating life test test item the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) test condition description LA12540 reliability test: part no. mil-std-883:1008 jis c 7021: b-10 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 reference standard page 4/4
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